ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,653, issued on Sept. 30, was assigned to EXFO Inc. (Quebec, Canada).
"Adapter tip and microscope system for inspecting duplex fiber-optic connector endfaces" was invented by Olivier Cote (Quebec, Canada), Mario L'Heureux (Quebec, Canada) and Raphael Laberge (Quebec, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of...