US Patent Issued to EWHA UNIVERSITY-INDUSTRY COLLABORATION FOUNDATION on Dec. 30 for "Analysis device and method for detecting variable vulnerability in software using machine learning model" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,221, issued on Dec. 30, was assigned to EWHA UNIVERSITY-INDUSTRY COLLABORATION FOUNDATION (Seoul, South Korea).

"Analysis device and method for detecting variable vulnerability in software using machine learning model" was invented by Byoung Ju Choi (Seoul, South Korea) and Ji Hyun Park (Goyang-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a device and method for detecting a variable vulnerability in software using a machine learning (ML) model. The method performed by an analysis device includes receiving a source code of a program to be analyzed, replacing call functions, variable names, and call stack functions in an...