US Patent Issued to Evident on April 22 for "Inspection analysis method and inspection analysis system" (Japanese Inventor)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,279,752, issued on April 22, was assigned to Evident Corp. (Nagano, Japan).

"Inspection analysis method and inspection analysis system" was invented by Hideyoshi Yamauchi (Akiruno, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection analysis method includes an analysis step, a prediction step, and an output step. A processor analyzes inspection information related to an operation in an inspection and generates first operation data and second operation data indicating a content of the operation in the analysis step. The first operation data indicate a content of the operation in a first inspection. The second operation data indicate a conte...