US Patent Issued to ETROLOGY on Oct. 7 for "System and method for denoising a region of interest of a pattern" (Israeli Inventor)

ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,372, issued on Oct. 7, was assigned to ETROLOGY LLC (Sandy, Ore.).

"System and method for denoising a region of interest of a pattern" was invented by Vladislav Kaplan (Baanana, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for denoising a grey scale image of a pattern on a substrate, including: scanning an electron beam along a pattern, detecting a scan line waveform from the scanned electron beam, obtaining a model scan line waveform from the detected scan line waveform, augmenting the model scan line waveform and adding noise to the augmented model scan line waveform, inputting the noisy augmented model scan line throug...