ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,813, issued on Oct. 28, was assigned to Ethernovia Inc. (San Jose, Calif.).
"Unified test interface for testing a system" was invented by Anil Tukaram Dhonde (Amsterdam), Darren S. Engelkemier (Menlo Park, Calif.), Roy T. Myers Jr. (Morgan City, Calif.) and Hossein Sedarat (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments provide for a unified interface for testing a system, which can include a device under test (DUT). In particular, some embodiments described herein can be used to implement a Unified Test Framework (UTF) that comprises an architecture that provides a unified (or common) software interface to one o...