US Patent Issued to Entrokey Labs on Jan. 27 for "AI-enhanced entropy measurement system for randomness evaluation" (Wyoming Inventor)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,411, issued on Jan. 27, was assigned to Entrokey Labs Inc. (Cheyenne, Wyo.).

"AI-enhanced entropy measurement system for randomness evaluation" was invented by Scott Streit (Cheyenne, Wyo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for estimating the entropy of bit sequences using a hybrid deep learning model. The system employs a neural network model that integrates statistical and pattern-based analysis to assess entropy. A min-entropy estimation function determines randomness levels, while a convolutional neural network (CNN) extracts sequential patterns. The system leverages a structured training approach with configurabl...