ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,125, issued on Nov. 4, was assigned to ENPLAS Corp. (Kawaguchi, Japan).
"Contact probe" was invented by Hiroyuki Ichikawa (Kawaguchi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A contact probe that includes a tubular structure, an engagement part and an elastic member. The elastic member is received within the tubular structure; the engagement part is arranged within the tubular structure; a part of the elastic member is arranged in the tubular structure, a first end of the elastic member is engaged with the engagement part, the elastic member abuts closely against an inner wall of the tubular structure, and a part of the tubular structure ...