ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,948, issued on Nov. 11, was assigned to Enplas Corp. (Kawaguchi, Japan).
"Contact probe" was invented by Ichikawa Hiroyuki (Kawaguchi, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An embodiment of the present application provides a contact probe, which comprises a tubular structure, an engagement part, a pushing part and an elastic member. The elastic member is received within the tubular structure; the engagement part is arranged within the tubular structure; the pushing part is arranged within the tubular structure and is arranged at the inner wall of the tubular structure opposite to the engagement part; a part of the elastic member is ar...