US Patent Issued to Enersoft on Nov. 25 for "Geological analysis system, devices, and methods using x-ray fluorescence and spectroscopy" (Canadian Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,896, issued on Nov. 25, was assigned to Enersoft Inc. (Calgary, Canada).

"Geological analysis system, devices, and methods using x-ray fluorescence and spectroscopy" was invented by Yannai Z. R. Segal (Calgary, Canada) and Grant I. Sanden (Calgary, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "A geological analysis system, device, and method using x-ray fluorescence and spectroscopy are provided. The geological analysis system includes a sample tray which holds the geological sample materials, and sensors including an X-ray fluorescence (XRF) unit and spectrometer. The sample tray includes chambers formed in an upper surface, ports, and pass...