US Patent Issued to EMCORE on July 8 for "In-situ residual intensity noise measurement method and system" (Massachusetts, Connecticut Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,571, issued on July 8, was assigned to EMCORE Corp. (Alhambra, Calif.).

"In-situ residual intensity noise measurement method and system" was invented by Jan Amir Khan (Windsor, Conn.) and Vijay Ramareddy (Revere, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of determining residual intensity noise (RIN) of a sensor may comprise determining a first amplitude of a first harmonic of the sensor while a signal propagating through the sensor is modulated at a modulating frequency corresponding to twice an eigenfrequency of the sensor. The method may further comprise determining a second amplitude of a second harmonic of the sensor while the...