US Patent Issued to EM Microelectronic-Marin on Nov. 18 for "Test logic method for an integrated circuit device" (Swiss Inventor)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,396, issued on Nov. 18, was assigned to EM Microelectronic-Marin SA (Marin, Switzerland).

"Test logic method for an integrated circuit device" was invented by Ovidiu Sima (Zurich).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test logic method (500) for an Integrated Circuit Device (100) including a main Integrated Circuit device (200) and an auxiliary Integrated Circuit device (300) having an auxiliary logical internal state (340). The method (500) includes a request (610), wherein a main configuration register (210) requests (610) testing (740) of an auxiliary logic circuit (330) via an auxiliary test logic circuit (350), testing (740), wherein ...