US Patent Issued to EM labs on Sept. 30 for "Dielectric characteristic measurement method and dielectric characteristic measurement system using open resonator" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,509, issued on Sept. 30, was assigned to EM labs Inc. (Hyogo, Japan).

"Dielectric characteristic measurement method and dielectric characteristic measurement system using open resonator" was invented by Yoshiyuki Yanagimoto (Hyogo, Japan) and Atsushi Hattori (Hyogo, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In a dielectric characteristic measurement method, a step of mounting a sample of which dielectric characteristic is measured on an open resonator and adjusting a position of the sample includes: a first measurement step for performing a first resonance measurement by sweeping a predetermined sweep frequency range at a first number of...