ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,600, issued on Feb. 18, was assigned to ELTA SYSTEMS LTD. (Ashdod, Israel).
"System and method for characterizing properties of EM signals" was invented by Benyamin Almog (Givat Brener, Israel) and Nadav Oxenfeld (Ramat Raziel, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system are presented for determining properties of an electromagnetic waveform. The method comprises: providing measured parametric EM field data indicative of measured vector components of electric and magnetic fields of an EM waveform measured in at least one instance of time: providing reference data indicative of a plurality of reference data sets, each da...