ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,664, issued on May 27, was assigned to Elite Semiconductor Microelectronics Technology Inc. (Hsinchu, Taiwan).
"Capacitance measurement circuit" was invented by Yi-Chou Huang (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A capacitance measurement circuit includes a charge to voltage converter (CVC) that includes at least one first variable capacitor, an excitation signal generation circuit, a differential amplifier, a first switch circuit, and at least one second variable capacitor, wherein a parasitic capacitance from a sensing capacitance sensed by a capacitance sensor is reduced by the at least one first variable capacitor. The ...