US Patent Issued to Elemental Scientific on Nov. 25 for "Nanoparticle baseline and particle detection threshold determination through iterative outlier removal" (Nebraska Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,482,642, issued on Nov. 25, was assigned to Elemental Scientific Inc. (Omaha, Neb.).

"Nanoparticle baseline and particle detection threshold determination through iterative outlier removal" was invented by Cole J. Nardini (Omaha, Neb.), Austin Schultz (Omaha, Neb.) and Daniel R. Wiederin (Omaha, Neb.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for iterative removal of outlier data from spectrometry data to determine one or more of a particle baseline and a detection threshold for nanoparticles are described. Ion signal intensity values that exceed an outlier threshold value associated with a sum of a first multiple of an average o...