US Patent Issued to Electronics and Telecommunications Research Institute on Dec. 2 for "Quantum diagnostic circuit and quantum characteristic diagnostic method" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,896, issued on Dec. 2, was assigned to Electronics and Telecommunications Research Institute (Daejeon, South Korea).

"Quantum diagnostic circuit and quantum characteristic diagnostic method" was invented by Sungik Jun (Daejeon, South Korea), Kwang-Won Koh (Daejeon, South Korea), Kang Ho Kim (Daejeon, South Korea), Changdae Kim (Daejeon, South Korea) and Taehoon Kim (Daejeon, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a quantum diagnostic circuit, which includes an input unit having an input of at least first to fourth qubits, a diagnostic circuit unit receiving the first to fourth qubits from the input unit and providing ...