US Patent Issued to ELDICO SCIENTIFIC on Sept. 16 for "Diffractometer for charged-particle crystallography" (German, Swiss Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,893, issued on Sept. 16, was assigned to ELDICO SCIENTIFIC AG (Allschwil, Switzerland).

"Diffractometer for charged-particle crystallography" was invented by Gunther Steinfeld (Waedenswil, Switzerland), Gustavo Santiso-Quinones (Albbruck-Birkingen, Germany) and Eric Hovestreydt (Karlsruhe, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a diffractometer for charged-particle crystallography of a crystalline sample, in particular for electron crystallography of a crystalline sample. The diffractometer comprises a charged-particle source for generating a charged-particle beam along a charged-particle beam axis, ...