US Patent Issued to EIGEN INNOVATIONS on Dec. 23 for "System and method for defect detection using visible light cameras with synchronized lighting" (Canadian Inventor)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,527, issued on Dec. 23, was assigned to EIGEN INNOVATIONS INC. (Fredericton, Canada).

"System and method for defect detection using visible light cameras with synchronized lighting" was invented by Jacob Wilson (Fredericton, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "System and method that includes: projecting a dynamic lighting pattern from a controlled lighting device towards a manufactured object; capturing a light response of the object, over an inspection period, to the dynamic lighting pattern and generating a set of image frames representing the captured lighting response; processing the set of image frames to generate an intensity...