US Patent Issued to EDAN INSTRUMENTS on Aug. 19 for "Detection probe, transmission device, and detection instrument" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,390,193, issued on Aug. 19, was assigned to EDAN INSTRUMENTS INC. (Shenzhen, China).

"Detection probe, transmission device, and detection instrument" was invented by Hua Luo (Shenzhen, China), Dan Zhou (Shenzhen, China), Qi Ma (Shenzhen, China), Bo Ouyang (Shenzhen, China) and Jianhua Mo (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A detection probe, a transmission device, and a detection instrument. The detection probe includes a housing defining a receiving space, a detection mechanism disposed on an end of the housing and configured to perform a detection function, a drive mechanism disposed in the receiving space and configured to...