US Patent Issued to ECOLE POLYTECHNIQUE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE on Aug. 26 for "System for polarimetric characterization of a target" (French Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,396,619, issued on Aug. 26, was assigned to ECOLE POLYTECHNIQUE (Palaiseau, France) and CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (Paris).

"System for polarimetric characterization of a target" was invented by Angelo Pierangelo (Palaiseau, France) and Arvid Olof Lindberg (Palaiseau, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for polarimetric characterization of a target that includes a liquid light guide (LLG) for propagating light from a light source to the target (S) at least one of a Polarization State Analyzer (PSA) serving to analyze polarization of light having propagated into the LLG and that has been reflected by the targe...