ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,536,643, issued on Jan. 27, was assigned to ecoATM LLC (San Diego).

"Methods and systems for detecting cracks in illuminated electronic device screens" was invented by Babak Forutanpour (San Diego) and Jeffrey Ploetner (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for detecting the cracks in illuminated electronic device screens are disclosed. In one embodiment, the method includes receiving an image of an electronic device screen and retrieving a plurality of kernels, each having values corresponding to a line region and a non-line region, with the orientation of the line region and the non-line region differing for each...