ALEXANDRIA, Va., April 2 -- United States Patent no. 12,266,001, issued on April 1, was assigned to eBay Inc. (San Jose, Calif.).
"Garment size mapping" was invented by Jonathan Su (San Jose, Calif.), Mihir Naware (Redwood City, Calif.), Jatin Chhugani (Santa Clara, Calif.) and Neelakantan Sundaresan (Mountain View, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for mapping size information associated with a client to target brands, garments, sizes, shapes, and styles for which there is no standardized correlation. The size information associated with a client may be generated by modeling client garments, accessing computer aided drawing (CAD) files associated with client garments, or by an...