US Patent Issued to DUKE UNIVERSITY on Feb. 10 for "Rapid coherent synthetic wavelength interferometric absolute distance measurement" (North Carolina Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,582, issued on Feb. 10, was assigned to DUKE UNIVERSITY (Durham, N.C.).

"Rapid coherent synthetic wavelength interferometric absolute distance measurement" was invented by Joseph A. Izatt (Durham, N.C.), Al-Hafeez Z. Dhalla (Durham, N.C.) and Jingkai Zhang (Durham, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of rapid coherent synthetic wavelength interferometric absolute distance measurement includes receiving, from an optical system, an image from an object scene of at least two distinct wavelengths of light, each wavelength's light source having a coherence length greater than a desired ambiguity length of the absolute distance me...