ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,073, issued on Dec. 9, was assigned to dSPACE GMBH (Paderborn, Germany).
"Test arrangement for testing a power electronics controller" was invented by Daniel Epping (Paderborn, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test arrangement for testing a power electronics controller, wherein the controller has supply connections and load connections. A plurality of power electronics modules each have supply connections, at least one load connection, and an interface for controlling the power electronics module. In an operational state of the test arrangement, the supply connections of the controller are each connected to the load connection...