ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,798, issued on Aug. 19, was assigned to Dong Weon Hwang (Seongnam-si, South Korea) and HICON Co. LTD. (Seongnam-si, South Korea).
"Socket device for testing ICS" was invented by Dong Weon Hwang (Seongnam-si, South Korea), Logan Jae Hwang (Beverly Hills, Calif.) and Jae Baek Hwang (Seongnam-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Proposed is a socket device for testing integrated circuits (ICs) used to test ICs. The socket device includes a contact module (100) for seating an IC and having a plurality of contacts (110) for electrical connection of a lead of the IC and a terminal of a printed circuit board (PCB), and a pusher mo...