ALEXANDRIA, Va., Feb. 12 -- United States Patent no. 12,222,328, issued on Feb. 11, was assigned to DISCO Corp. (Tokyo).
"Testing apparatus and testing method" was invented by Makoto Kobayashi (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A testing apparatus includes a support unit that supports a lower surface side of a test piece, a pressing unit having an indenter that presses the test piece supported by the support unit, a drive unit that raises and lowers the pressing unit, a load measurement instrument that measures a load generated when the indenter presses the test piece supported by the support unit, and a controller that controls raising and lowering of the pressing unit. The controller is ...