ALEXANDRIA, Va., June 10 -- United States Patent no. 12,295,080, issued on May 6, was assigned to Diodes Inc. (Plano, Texas).
"Fault diagnosis apparatus and method" was invented by Dongjie Cheng (Murphy, Texas), Harish Raikar (Belagavi, India), Arvind Patil (Hubballi, India) and Akshay Panchamukhi (Hubballi, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus includes a clamping circuit configured to provide a predetermined voltage at an output of the clamping circuit, a clamping switch coupled to the output of the clamping circuit, and a pass device connected between the clamping switch and an input/output terminal of a controller."
The patent was filed on Nov. 15, 2022, under Application No....