US Patent Issued to Diodes on July 15 for "System and method for automatic height adjustment for chip testing" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,360,157, issued on July 15, was assigned to Diodes Inc. (Plano, Texas).

"System and method for automatic height adjustment for chip testing" was invented by Jie Ren (Chengdu, China), Gan Yao (Chengdu, China) and Yu Liu (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes configuring a preset reference pulse number, and controlling a test contact piece for testing chip leads to move toward a target chip lead, using a control signal corresponding to the preset reference pulse number. First data is continuously obtained and used to determine whether the test contact piece is in contact with the target chip lead. When the test co...