ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,103, issued on Nov. 18, was assigned to DH TECHNOLOGIES DEVELOPMENT PTE. LTD. (Singapore).
"Signal-to-Noise improvement in fourier transform quadrupole mass spectrometer" was invented by James W. Hager (Concord, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "In one aspect, a method of performing Fourier Transform (FT) mass spectrometry is disclosed, which comprises passing a plurality of ions through an FT mass analyzer comprising a plurality of rods arranged in a multipole configuration, where the plurality of rods include an input port for receiving ions and an output port through which ions can exit the mass analyzer. The method can furthe...