ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,539,093, issued on Feb. 3, was assigned to DETECTION TECHNOLOGY OYJ (Oulu, Finland).
"Dual-energy imaging device and method" was invented by Mikko Matikkala (Oulu, Finland).
According to the abstract* released by the U.S. Patent & Trademark Office: "It is an object to provide a device and a method for x-ray and/or gamma ray detection. According to an embodiment, a device comprises: a detector comprising a plurality of pixels, wherein the plurality of pixels comprises a first subset of pixels configured to detect incident x-ray or gamma ray radiation in a first energy range and a second subset of pixels configured to detect incident x-ray or gamma ray radiation in a second energy range...