ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,994, issued on Nov. 4, was assigned to DENSO Corp. (Kariya, Japan).
"Abnormality detection device" was invented by Atsushi Moribe (Kariya, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection device, method, or a storage medium acquires learning target data and monitoring target data, generates a state observer by using a variable in an input variable configuration, generates a threshold, calculates an abnormality degree by combining a second state observation value and the monitoring target data and inputting a combined result to the competitive neural network, and calculates a determination result."
The patent was filed on...