ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,698, issued on Jan. 20, was assigned to DENKA COMPANY Ltd. (Tokyo).
"Diagnostic testing device and diagnostic testing method" was invented by Chihfang Tien (Niigata, Japan), Risa Kohiyama (Niigata, Japan), Tomomi Takano (Niigata, Japan) and Takashi Miyazawa (Niigata, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A technology to determine an appropriate detection region in automatic determination of an immunochromatographic assay and an immunochromatographic assay interpretation device wherein a liquid sample including a detectable substance spreads into a region for detection via a test strip, and a negative or positive determination is made ...