US Patent Issued to Denka on Feb. 25 for "Immunochromatographic test piece and specimen adding device for extracting and measuring sugar chain antigen, and immunochromatography method using same" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,235,265, issued on Feb. 25, was assigned to Denka Co. Ltd. (Tokyo).

"Immunochromatographic test piece and specimen adding device for extracting and measuring sugar chain antigen, and immunochromatography method using same" was invented by Daisuke Kato (Niigata, Japan), Tomohiro Hattori (Niigata, Japan) and Shino Muramatsu (Niigata, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to an immunochromatography test method of measuring a sugar chain antigen, which provides an immunochromatographic test piece and a specimen adding device capable of specifically measuring a sugar chain antigen, and an immunochromatography meth...