ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,493,031, issued on Dec. 9, was assigned to DENKA COMPANY Ltd. (Tokyo).
"Diagnostic testing device and diagnostic testing method" was invented by Chihfang Tien (Niigata, Japan), Risa Kohiyama (Niigata, Japan), Tomomi Takano (Niigata, Japan) and Takashi Miyazawa (Niigata, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A diagnostic testing device is a testing-device for immunochromatography wherein a liquid sample contains an analyte developed in a detection area via a labeling-substance-containing area of a test strip, and a negative or positive interpretation is made from the coloration exhibited by the detection area. The device includes a measurin...