US Patent Issued to DELTA ELECTRONICS, NATIONAL CHENG KUNG UNIVERSITY on Dec. 2 for "Examination system and examination method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,604, issued on Dec. 2, was assigned to DELTA ELECTRONICS INC. (Taoyuan, Taiwan) and NATIONAL CHENG KUNG UNIVERSITY (Tainan, Taiwan).

"Examination system and examination method thereof" was invented by Chih-Yang Chen (Taoyuan, Taiwan), Pau-Choo Chung Chan (Tainan, Taiwan) and Sheng-Hao Tseng (Tainan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An examination system is provided. The examination system includes an optical detector and analyzer. The optical detector emits a detection light source toward a target object and detects a respondent light which is induced from the target object in response to the detection light source to generate im...