ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,637, issued on June 24, was assigned to Delta Design Inc. (Poway, Calif.).

"Optimizing semiconductor manufacturing processes using machine learning" was invented by Ryan Stoddard (Shoreline, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some embodiments, a computer-implemented method of controlling a semiconductor manufacturing process is provided. A computing system generates predicted metrology values for a current run and a next run by providing metrology forecast inputs to a metrology forecast model. The computing system generates an updated recipe for executing at least one semiconductor manufacturing process step using the predicted ...