ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,229, issued on Sept. 30, was assigned to Dell Products LP (Round Rock, Texas).
"Intelligent way to select regression test cases in system test" was invented by Chaojun Zhao (Chengdu, China), Weilan Pu (Chengdu, China), Shuangshuang Liang (Zunyi, China), Yang Zhang (Chengdu, China) and Jingyi Wang (Chengdu, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting, by a test selection system, a regression test case from a plurality of regression test cases in a software testing lifecycle system. The t...