US Patent Issued to Dell Products on Sept. 30 for "Intelligent score based OOM test baseline mechanism" (Chinese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,219, issued on Sept. 30, was assigned to Dell Products LP (Round Rock, Texas).

"Intelligent score based OOM test baseline mechanism" was invented by Huijuan Fan (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for an Out of Memory test baseline system are provided herein. An example method includes executing a plurality of test cases on a system. A test score calculation module calculates a test case score for each of the executed test cases in a subset of the plurality of test cases. An Out of Memory (OOM) test baseline configuration system trains a machine learnin...