US Patent Issued to Dell Products on Sept. 16 for "Device failure analysis utilizing aggregated views of multiple images of devices" (Indian, American Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,525, issued on Sept. 16, was assigned to Dell Products LP (Round Rock, Texas).

"Device failure analysis utilizing aggregated views of multiple images of devices" was invented by Ravi Shukla (Bengaluru, India), An Chung (Pflugerville, Texas), Jimmy Henry Wiggers (Cedar Park, Texas) and Sudipta Pradhan (Kharagpur, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus comprises a processing device configured to obtain a plurality of images each comprising at least a given portion of an instance of a computing device and to detect, utilizing an image classification machine learning model, at least a subset of the plurality of images having ...