US Patent Issued to Dell Products on Nov. 25 for "Method for lineage sampling to efficiently detect corruptions" (American, Indian Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,481,641, issued on Nov. 25, was assigned to Dell Products LP (Round Rock, Texas).

"Method for lineage sampling to efficiently detect corruptions" was invented by Nitin Madan (Cupertino, Calif.), Bhimsen Bhanjois (Fremont, Calif.) and Kiran Kumar Malle Gowda (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Corruption detection in backups is disclosed. Backups that are received into a backup environment are stored in corresponding lineages. A detection engine is configured to perform corruption detection operations on the most recent backups in each of the lineages based on a sample frequency. Corruption detection operations may also be pe...