US Patent Issued to Dell Products on Feb. 18 for "Smart test case execution cycle assignment mechanism" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,229,042, issued on Feb. 18, was assigned to Dell Products LP (Round Rock, Texas).

"Smart test case execution cycle assignment mechanism" was invented by Huijuan Fan (Chengdu, China) and Jia Huang (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, system, and non-transitory processor-readable storage medium for feature coverage system are provided herein. An example method includes selecting a test case from a plurality of test cases in a software testing lifecycle system. A feature coverage system calculates a weighted metric associated with a test cycle for each test cycle in a plurality of test cycles, where each of the plurality ...