ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,118, issued on Nov. 11, was assigned to Deere & Co. (Moline, Ill.).
"System and method for measuring leaf-to-stem ratio" was invented by Mahesh Somarowthu (Pune, India), Sameer Gorivale (Pune, India) and Mohan A. Vadnere (Pune, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for determining a leaf-to-stem ratio of a crop automatically from an image of the crop. An agricultural vehicle may include a crop analysis system having a computing device and an imaging device for capturing an image of a crop. The computing device analyzes images acquired by the imaging determine to determine a leaf-to-stem ratio of the cr...