US Patent Issued to Deere & Co. on June 17 for "Determining cereal grain crop yield based on cereal grain trait value(s)" (California Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,424, issued on June 17, was assigned to Deere & Co. (Moline, Ill.).

"Determining cereal grain crop yield based on cereal grain trait value(s)" was invented by Zhiqiang Yuan (San Jose, Calif.) and Theodore Monyak (San Francisco).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are disclosed that enable generating a predicted yield for a cereal grain crop based on one or more traits extracted from image(s) of the cereal grain crop. Various implementations include determining a heading trait value based on the number of identified spikelets, where the spikelets are identified by processing the image(s) of the cereal grain crop using a spikelet ...