US Patent Issued to DEEPX on June 24 for "System-on-chip and method for performing a diagnosis during runtime" (South Korean Inventor)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,758, issued on June 24, was assigned to DEEPX Co. LTD. (Seongnam-si, South Korea).

"System-on-chip and method for performing a diagnosis during runtime" was invented by Lok Won Kim (Seongnam-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system on chip (SoC) for testing a component in a system during runtime includes a plurality of functional components; a system bus for allowing the plurality of functional components to communicate with each other; one or more wrappers, each connected to one of the plurality of functional components; and an in-system component tester (ICT). The ICT monitors, via the wrappers, states of the functio...