ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,318, issued on June 24, was assigned to DEEPX Co. LTD. (Seongnam-si, South Korea).
"NPU capable of being tested during runtime" was invented by Lok Won Kim (Seongnam-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "This disclosure proposes an inventive system capable of testing a component in the system during runtime. The system may comprise: a substrate; a plurality of functional components, of the plurality of functional components being mounted onto the substrate and including a circuitry; a system bus formed with electrically conductive pattern onto the substrate thereby allowing the plurality of functional components to communica...