ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,435,241, issued on Oct. 7, was assigned to DECISION TREE LLC (Greeley, Colo.) and VERACIO LTD. (Salt Lake City).

"Systems and methods for improved material sample analysis and quality control" was invented by Brandon Lee Goodchild Drake (Greeley, Colo.) and Ry Nathaniel Zawadzki (Belmont, Australia).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein are methods and systems for improved material sample analysis and quality control. A computing device may receive sample data associated with a plurality of material samples. The computing device may determine a first subset of the plurality of material samples and a second subset of the plurality ...