ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,314, issued on Aug. 5, was assigned to Datacolor Inc. (Lawrenceville, N.J.).

"Method and apparatus for measuring surface gloss and spectral reflectance" was invented by Zhiling Xu (Princeton Junction, N.J.), Nilesh B. Dhote (Ewing, N.J.), David Williams (Westampton, N.J.), Seaver Li (Belle Mead, N.J.), William Binder (Lakeville, Pa.) and Venkata R. Thumu (Pennington, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes controlling a gloss channel of a color measurement apparatus to measure a surface gloss of a color sample to generate a gloss value for the color sample. A color channel of the color measurement apparatus is controlled...