US Patent Issued to DAIDO KOGYO on June 24 for "Chain measurement device, chain measurement system, and method for calculating slack amount of chain" (Japanese Inventors)

ALEXANDRIA, Va., June 25 -- United States Patent no. 12,339,187, issued on June 24, was assigned to DAIDO KOGYO Co. LTD. (Ishikawa, Japan).

"Chain measurement device, chain measurement system, and method for calculating slack amount of chain" was invented by Daigo Masumoto (Ishikawa, Japan), Tadashi Sekido (Ishikawa, Japan), Yoshiaki Sawade (Ishikawa, Japan), Naoto Himiyama (Ishikawa, Japan) and Sora Demura (Ishikawa, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A chain measurement device is for measuring a slack amount of a chain wound around sprockets. The chain measurement device includes a main body portion including an acceleration sensor, and an attachment portion configured to attach the main ...