ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,254, issued on Jan. 20, was assigned to Cypress Semiconductor Corp. (San Jose, Calif.).
"Fault overrun detection feature" was invented by Sumeet Mali (Dublin), Kai Dieffenbach (Egelsbach, Germany), Richard Landenbach (Langen, Germany), Uwe Moslehner (Geiselbach, Germany) and Thiyagu Loganathan (Baldham, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are disclosed for a fault monitor to determine that no fault has been lost. The fault monitor may distinguish between critical and non-critical faults without the risk of missing a critical fault. The fault monitor may detect a new fault event from a fault source and may set a fault ov...