ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,483,216, issued on Nov. 25, was assigned to Crystal Instruments Corp. (Santa Clara, Calif.).
"Data recording based on dual ADC architecture" was invented by James Q. Zhuge (Palo Alto, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement system has a data acquisition architecture in one or more channels with storage in multiple sensor ranges. At least one sensor channel provides an analog measurement input signal, which is split into first and second amplifier-ADC paths, where a first path has relatively higher gain and smaller range than a second path. The digitized data is subject to cross-channel calibration that can serve as a trigger ...